Showing results: 466 - 480 of 601 items found.
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HS-QSD -
HenergySolar
HS-QSD Quick Silicon Discriminator is specially designed for silicon sorting，it can quickly test the silicon type, heavy-dopedt, and can be widely used in all kinds of silicon sorting, like granular polysilicon material, break semiconduct silicon wafer, chunk material, top and tail material and so on. With the three probes, it could show type and heavy type simultaneously, strongly improved the sorting efficiency.
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KMF 1 -
BAUR Prüf- und Messtechnik GmbH
Cable fault location with the BAUR KMF 1. The KMF 1 search receiver is used according to the step voltage method. The cable line is scanned with two measurement probes that can be dismantled during transport. The battery-operated device is also suitable for locating multiple consecutive sheath faults.* Battery mode* Zero point compensation* accurate location of cable sheath faults* battery test
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CX-T04 -
Shenzhen Chuangxin Instruments Co., Ltd.
This Spring Impact hammer is strictly designed according to IEC60068-2-75, IEC884 and UL1244 GB/T2423.55-2006, GB4706.1, GB8898 and GB7000 standards. It is used to test the mechanical integrity of product enclosures. After applying the impact with the hammer, the product is examined with accessibility probes to determine access to shock, energy, and injury hazards. Built in exact accordance to IEC\EN, \UL\CSA and other international Standards.
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Maury Microwave Corporation
AMCAD Engineering has created professional, industry-proven pulsing technology for both pulsed-bias load pull (Pulsed Load Pull, PLP) and 50ohm transistor test applications. Systems come equipped with a mainframe controller which includes integrated power supplies and integrated input pulser with ±25V/200mA capability. The external output pulser module (probes, pulsers) is configured for 120V/30A pulsing.
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FS2601 -
FuturePlus Systems
The FS2601 is one of our newest and fastest logic analyzer probes used to test DDR5 memory. It is designed to work exclusively with 4 Keysight U4164A logic analysis modules operating in either Quad Sample State or Quarter Channel 10GHz timing modes. This gives the user an extremely effective tool for debugging, testing and verifying DDR5 UDIMMs running above 4000MT/s.
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FS2600A -
FuturePlus Systems
The FS2600A is our newest and fastest logic analyzer probe used to test DDR5 RDIMM and LRDIMM memory. It is designed to work exclusively with 4 Keysight U4164A logic analysis modules operating in either Quad Sample State or Quarter Channel 10GHz timing modes. This gives the user an extremely effective tool for debugging, testing and verifying DDR5 RDIMM/LRDIMMs and DDR5 Memory Channels.
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Medalist i1000 Systems -
Keysight Technologies
Cover Extend Technology (CET) is now supported on the Medalist i1000D. The i1000D only requires a VTEP MUX card to enable CET. If you are already using test fixtures with VTEP MUX cards , you can now implement CET without any fixture modification. Simply add new VTEP probes to devices that were previously not testable. This greatly reduces implementation efforts.
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855 -
TEGAM Inc.
The ideal solution for anyone that needs a hand held, multi-purpose calibrator to perform field or lab tests on temperature probes or thermometers. The 855 meter will simulate, source, measure and record the same thermocouple types as the 850, K-J-T-E, and adds N-B-R-S-G-C-D types. The meter also supports 1000, 100k, 100 RTD''s but does not support thermistor''s.
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Circuit Check, Inc.
Circuit Check began Strain Gauge Testing in 1999 when BGA/SMT technology started replacing PTH components, reducing strain levels was a reactive post fixture fabrication process. We quickly recognized that the “reactionary” process was neither efficient nor were we capable on knowing the lowest achievable strain levels. Our engineering team came up with visual tools utilized during design to easily identify areas of excessive probe force, though still not enough data was generated to identify the lowest possible strain. Finite Element Analysis software models the PCBA and test fixture and applies the pressures from test probes and board supports and indicates the micro strain level applied to the PCBA. Using the FEA software during our design process allows our engineers to modify fixture designs to attain the lowest possible micro strain before fabrication begins.
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PCI EmbeddedComputer Systems
The 3U power test module is an ideal solution for evaluating heat dissipation in a rugged conduction cooled VPX cage or chassis. This card is a thermal load in the chassis to evaluate the heat dissipation. The chassis can be monitored with temp sensing probes and or FLIR imaging. Different wattages are selected by setting dip switches. The +5 and 3.3V loads are on the top of the module. The +12V and -12V loads are on the bottom side of the module.
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CT Serie -
Test-X Fixture Products
The CT Series Mechanical Kits, utilizing the patented CAM mechanism1, offset the same precision linear motion. The 'Z' axis motion is ideal for a larger point count mechanical test applications.The CT Series features a hinged 3/8" FR4 probe board, tooling holes for precision alignment, removable sides, precision shafts and cam slide block assemblies, and a pan latch assembly.
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1503 -
Fluke Corporation
The Fluke 1503 is a great choice for basic residential and commercial electrical insulation testing. This rugged, compact tool fits in the palm of your hand. The 1503 is the same form factor as the Fluke 1507 but with a few less features. You can count on it to handle the most common tests at a most affordable price. Additional features, like the remote probe, reduce the time needed to perform repetitive testing.
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Spectrum Instrumentation
Adapter Cables connect your Spectrum card or instrument with your device under test, your sensor, your transmitter or receiver, your external machine, your prototype equipment or simply with a probe for measuring. To fulfill a lot of different requirements Spectrum is offering adapter cables between different types of connections and with different length. These adapter cables are manufactured for Spectrum following Spectrum's specification.
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3 Series MDO -
Tektronix, Inc.
With the largest display in class, improved low-level signal measurement accuracy and industry-leading probe performance, the 3 Series MDO sets a new standard for bench oscilloscopes. Whether you’re testing your baseband design for IoT or just for simple EMI sniffing, the 3 Series has a unique true hardware spectrum analyzer built right in with superior RF test performance and guaranteed RF specifications.
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Imapact 7BT -
Lorlin Test Systems
The 7BT Benchtop Discrete Component Tester is designed to test small signal and power semiconductor components in both single and multi-device packages or hybrids.. The 7BT automatic test system can be used in all test applications including incoming inspection, wafer probe, QC, engineering, production, final test, and high reliability. The system tests most all discrete semiconductors with reliable, accurate, and repeatable results and uses a Windows 10 64-BIT Operating Systems and a USB 2.0 Interface.
